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High Performance

Atomic-scale of resolution
Large sample size
DSP(Digital Signal Processing) for great performance
Real time operating system embedded
Fast Ethernet connection with computer


Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
Force Analysis: I-V Curve, I-Z Curve, Force Curve
Online real-time 3D image for better observation
Multi-channel signals for more sample details
Trace-Retrace scan, Back-Forward scan
Multi-Analysis: Granularity and Roughness
Data load-out for further analysis

Easy Operation

Fast automatically tip-engaging
Easy change of the tip holder, for simple switching between STM and AFM
Full digital control, auto system status recognition
Software-based sample movement
Nano-Movie function: Continuous data collection, storage and replay
Modularized design for convenient maintenance and future upgrades
Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
AFM: 0.26nm lateral, 0.1nm vertical

X-Y scan scope:~10 micrometer
Z distance:~2 micrometer
Image Pixels:128X128, 256X256, 512X512, 1024X1024
Scan Angle:0~360 degree
Scan Rate: 0.1~100Hz
CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet
Sample Size: Up to 45mm in diameter, reach 15mm when use a
AA2000/AA3000,and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and
precision of 50nm
Online Control Software and offline Image Processing Software for
Windows Vista/XP/2000/9x
AA2000 Atomic Force Microscope
Atomic Force Microscope and Scanning Probe Microscope
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