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Features

High Performance

Atomic-scale of resolution
Large sample size
DSP(Digital Signal Processing) for great performance
Real time operating system embedded
Fast Ethernet connection with computer

Multi-Function

Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
Force Analysis: I-V Curve, I-Z Curve, Force Curve
Online real-time 3D image for better observation
Multi-channel signals for more sample details
Trace-Retrace scan, Back-Forward scan
Multi-Analysis: Granularity and Roughness
Data load-out for further analysis

Easy Operation

Fast automatically tip-engaging
Easy change of the tip holder, for simple switching between STM and AFM
Full digital control, auto system status recognition
Software-based sample movement
Nano-Movie function: Continuous data collection, storage and replay
Modularized design for convenient maintenance and future upgrades
Specifications
Functions
Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
Resolution
AFM: 0.26nm lateral, 0.1nm vertical
Technical

Parameters
X-Y scan scope:~10 micrometer
Z distance:~2 micrometer
Image Pixels:128X128, 256X256, 512X512, 1024X1024
Scan Angle:0~360 degree
Scan Rate: 0.1~100Hz
Electronics
CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas
Instruments;
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet
Mechanics
Sample Size: Up to 45mm in diameter, reach 15mm when use a
AA2000/AA3000,and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and
precision of 50nm
Softwares
Online Control Software and offline Image Processing Software for
Windows Vista/XP/2000/9x
AA2000 Atomic Force Microscope
 
Atomic Force Microscope and Scanning Probe Microscope
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