2. Photoluminescence Spectrometer- OmniPL
Photoluminescence Spectrometer-OmniPL
The measurement of photoluminescence from semi-conductor materials has become an important characterisation method and is widely accepted to provide information on for example: carrier doping levels, alloy compositions, film structures, band gap and edge effects, etc. in applications ranging from scientific research, process monitoring, or device characterisation.
The standard ZLX-PL system is configured for the measurement of samples at room temperature and can be extended to include samples in either a nitrogen or helium cryostat for low temperature processes.
Diagram of System
Fluorescence Spectrometer-OmniFluoThe modular
ZLX-FS fluores...
Photoluminescence Spectrometer-OmniPLThe measurement of phot...
Steady-state Fluorescence Spectrometer
PMEye-3000 Photoluminescence spectral imaging measurement sy...
